Microscopic analysis

However, optical microscopy encounters its limits when observing objects and layers with dimensions smaller than 0.2 µm. To meet our customers' needs, we have established a collaboration with the Institute of Physics of Materials (IPM) at the Academy of Sciences, located in Brno. We are currently utilizing the Tescan LYRA 3 XMU FEG/SEM scanning electron microscope here, equipped with an EDS Ultimax detector and AZtec software.

We are capable of conducting the following measurements:

• Layer thickness measurements
• Measurement of the worst inclusion fields
• Measurement of depth and porosity in both coatings and base materials
• Particle distribution analysis
• Grain size measurements (using linear intercept and planimetric methods)
• Substrate material roughness measurements
• Determining the composition and chemical makeup of thin layers in the range of nanometers
• Evaluation of susceptibility to intergranular corrosion in wrought products made of aluminum alloys of the AL-P2XXX-, AL-P7XXX-series, and aluminum-lithium alloys, according to ČSN EN 2716

By determining the composition and chemical structure of individual layers, we also gain insights into the preparation process. These insights assist us in the expert activities of the SQI laboratory. We are then better equipped to identify defects that penetrate both the base material and the coating system and to assess their potential causes.

Our laboratory is ready to meet even the most demanding requirements and is capable of providing and ensuring analyses to achieve the best possible results. If you are interested in our services or require consultation, please do not hesitate to contact us.

Dealing with defects